30 August - 3 September 2026 in Warsaw, Poland
The DRIP Conference serves as a leading international forum for scientists and engineers from academia and industry to study point and extended defects in semiconductors using various detection, identification, and imaging techniques. Held every two years at renowned research centers worldwide since its inception, the event provides a unique platform to exchange knowledge on material growth, processing, and manufacturing technologies, specifically correlating these processes with the behavior of defects. The upcoming edition highlights the latest advances in analyzing, controlling, and understanding how these defects directly influence material properties, reliability, and overall device performance.